Electronic, magnetic & optical materials · Piezoelectric materials

Aluminum scandium nitride thin film

Aluminum scandium nitride thin film is a reference-depth piezoelectric nitride record for classification, search, comparison and later condition-specific enrichment.

Family
Piezoelectric nitride
Record
Reference
Conditions
1
Sources
3
Browse this family
More

01

Overview

This entry identifies and classifies the material. Verified engineering properties have not yet been added.

Material class
Electronic, magnetic & optical materials
Category
Piezoelectric materials
Family
Piezoelectric nitride
Product forms
Wafer, Crystal, Thin film, Powder

Composition

ConstituentMinMaxTypicalNote
Formula / systemAlScNIdentity field; not a quantitative formulation.

02

Properties and conditions

Engineering properties

No verified engineering-property values are listed for this material.

Conditions

reference

Reference material state

Purity, orientation, doping and processing state must be stated.

03

Processing and use

Processing

  • Properties depend on grade, condition, product form and processing route.

Applications

  • RF resonators, MEMS and piezoelectric actuators

Selection considerations

  • Reference-depth identity record. Verify the governing specification and condition-specific data before engineering use.

04

Standards and related materials

Standards and designations

No standard designation is listed.

Other names

  • AlScN

05

Sources and context

Sources

Confirm the applicable specification, product form and condition before using values for design or procurement.

Supply and sustainability

Purity, defect density, orientation and dopant control dominate usable performance.

Critical-element use, recovery and device lifetime should be assessed at system level.

Strategic context

Included in a strategic or critical-material collection; supply risk depends on grade, source and jurisdiction.

Critical inputs: AlScN

Basis: Public critical-mineral and energy-material assessments should be checked for the target jurisdiction and year.